23 results
NanoMi: An Open Source Electron Microscope Component Integration
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3164-3165
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- August 2022
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In-situ Calibration for Angle-resolved Valence EELS
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2032-2034
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- August 2022
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Damage in electron cryomicroscopy: Lessons from biology for materials science
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- MRS Bulletin / Volume 44 / Issue 12 / December 2019
- Published online by Cambridge University Press:
- 10 December 2019, pp. 935-941
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- December 2019
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Measurement of the Point Spread Function for Low-Loss Inelastic Scattering
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 676-677
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- August 2019
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Nature of the Vibrational-Loss EELS Peaks Measured from Ionic Specimens
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 618-619
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- August 2019
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In-Situ Mass Thickness Calibrations Using MWCNTs
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 792-793
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- August 2019
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Exploiting the Dose-Rate Dependence of Radiolysis – a Future for Cryo-STEM ?
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 992-993
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- August 2019
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Fundamental limit to single-atom analysis by STEM-EDX spectroscopy
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 380-381
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- July 2017
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Strategies for Obtaining High Spatial Resolution in Imaging and Spectroscopy of Beam-sensitive TEM Specimens
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 302-303
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- July 2016
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Taking Advantage of Scattering Delocalization To Reduce Radiation Damage In Vibrational or Valence-Loss EELS and Energy-Filtered TEM Images
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 960-961
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- July 2016
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The Use of Color in Elemental Maps and Electron-Microscope Images
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2241-2242
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- August 2015
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Opportunities for Low-Voltage TEM/STEM
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 349-350
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- August 2015
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Avoidance of Radiation Damage in Vibrational-Mode Energy-Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 659-660
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- August 2015
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Exploring Phonon Signals by High Energy / High Spatial Resolution EELS
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 66-67
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- August 2014
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Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 72-73
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- August 2014
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Prospects for Vibrational-Mode EELS with High Spatial Resolution
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- Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014
- Published online by Cambridge University Press:
- 19 February 2014, pp. 658-663
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- June 2014
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Beam-Induced Motion of Adatoms in the Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 19 / Issue 2 / April 2013
- Published online by Cambridge University Press:
- 21 February 2013, pp. 479-486
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- April 2013
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Electron Energy-Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 01 August 2003, pp. 1562-1563
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- August 2003
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Electron irradiation damage to aromatic compounds
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 986-987
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- August 2003
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EELS Characterization of Tin Oxides
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 854-855
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- August 2003
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